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1- Scanning electron microscopy, Type INSPECT F50. This SEM (Inspect F50) has a Schottky Field Emission gun (FEG) for high resolution. This instrument is high vacuum (<6e-4 Pa) and equipped with:
- Everhardt Thornley SED (secondary electron detector)
- Solid-state BSE (backscattered electron detector)
- Bruker EDS Microanalysis-X Flash Silicon Drift Detector (SDD)
2- X-Ray Diffraction. Type SHIMADZU 7000X. equipped with
- Auto sampler of 5-samples with holders
- Sample heating attachment for thermal phase transformation of materials
- Stress-strain attachment
3- X-Ray Fluorescence. Type SHIMADZU 1800
4- Seismic, gravity and magnetic instruments
5- Atomic absorption spectroscopy
6- Gas chromatograph
7- Flame photometer
8- Frantz magnetic separator
