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Faculty of Science

:

SciFacilities: Scanning Electron Microscope (SEM)

FacilityTitle

Scanning Electron Microscope (SEM)

FacilityImage

Department

Geology

Department:DepartmentName

Geology

Description

INSPECT F50, FEG

FEI Company, Netherland

It provides 3–dimensional images magnified up to 1,000,000 X. It is used in the fields of mineralogy, agronomy, paleontology, medicine and pharmacology, materials, nanotechnology …etc.  ……………..more details

Attachments

Created at 3/19/2012 11:04 AM by Alaa Saleh
Last modified at 3/19/2012 11:36 AM by Alaa Saleh